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dc.contributor.authorKurnaz, Cetin
dc.contributor.authorEngiz, Begum Korunur
dc.date.accessioned2020-06-21T13:27:00Z
dc.date.available2020-06-21T13:27:00Z
dc.date.issued2017
dc.identifier.isbn978-1-5090-3982-1
dc.identifier.urihttps://hdl.handle.net/20.500.12712/12686
dc.description40th International Conference on Telecommunications and Signal Processing (TSP) -- JUL 05-07, 2017 -- Barcelona, SPAINen_US
dc.descriptionWOS: 000425229000058en_US
dc.description.abstractAs a result of the enormous increase in usage of wireless systems; electromagnetic radiation (EMR) sources in residential areas as well as the exposed EMR levels has increased significantly. Therefore this study aims to determine the exposed E levels and characterize the electromagnetic environment on the basis of long term (24 hours) E measurements conducted at five different home environments. The measurements were collected using PMM 8053 EMR meter in band from 100 kHz to 3 GHz, and the electric field strength (E) was recorded. The measurement results show that the E originating from the base stations change significantly within a day, and the highest E is 6.21 V/m and the highest mean E is 3.59 V/m. Analysis of 24 hour measurements so as to division of a day into four equal parts show that afternoon and evening E levels are comparatively higher than those recorded during morning and night. Morning E level increases by 80.61% compared to night. At the end of the study to characterize the measured E levels with a distribution; fitting methods are applied to measured data. Since a Weibull distribution yield the lowest NRMSE; appears to be a candidate for a representation of the distribution of the measured E levels.en_US
dc.language.isoengen_US
dc.publisherIeeeen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.subjectElectric field strengthen_US
dc.subjectElectromagnetic (EM) measurementen_US
dc.subjectEM pollutionen_US
dc.subjectStatistical analysisen_US
dc.subjectE distributionen_US
dc.titleDistribution Fitting for Long Term Electric Field Strength Measurementsen_US
dc.typeconferenceObjecten_US
dc.contributor.departmentOMÜen_US
dc.identifier.startpage267en_US
dc.identifier.endpage270en_US
dc.relation.journal2017 40Th International Conference on Telecommunications and Signal Processing (Tsp)en_US
dc.relation.publicationcategoryKonferans Öğesi - Uluslararası - Kurum Öğretim Elemanıen_US


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