dc.contributor.author | Kurnaz, Cetin | |
dc.contributor.author | Engiz, Begum Korunur | |
dc.date.accessioned | 2020-06-21T13:27:00Z | |
dc.date.available | 2020-06-21T13:27:00Z | |
dc.date.issued | 2017 | |
dc.identifier.isbn | 978-1-5090-3982-1 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12712/12686 | |
dc.description | 40th International Conference on Telecommunications and Signal Processing (TSP) -- JUL 05-07, 2017 -- Barcelona, SPAIN | en_US |
dc.description | WOS: 000425229000058 | en_US |
dc.description.abstract | As a result of the enormous increase in usage of wireless systems; electromagnetic radiation (EMR) sources in residential areas as well as the exposed EMR levels has increased significantly. Therefore this study aims to determine the exposed E levels and characterize the electromagnetic environment on the basis of long term (24 hours) E measurements conducted at five different home environments. The measurements were collected using PMM 8053 EMR meter in band from 100 kHz to 3 GHz, and the electric field strength (E) was recorded. The measurement results show that the E originating from the base stations change significantly within a day, and the highest E is 6.21 V/m and the highest mean E is 3.59 V/m. Analysis of 24 hour measurements so as to division of a day into four equal parts show that afternoon and evening E levels are comparatively higher than those recorded during morning and night. Morning E level increases by 80.61% compared to night. At the end of the study to characterize the measured E levels with a distribution; fitting methods are applied to measured data. Since a Weibull distribution yield the lowest NRMSE; appears to be a candidate for a representation of the distribution of the measured E levels. | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Ieee | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.subject | Electric field strength | en_US |
dc.subject | Electromagnetic (EM) measurement | en_US |
dc.subject | EM pollution | en_US |
dc.subject | Statistical analysis | en_US |
dc.subject | E distribution | en_US |
dc.title | Distribution Fitting for Long Term Electric Field Strength Measurements | en_US |
dc.type | conferenceObject | en_US |
dc.contributor.department | OMÜ | en_US |
dc.identifier.startpage | 267 | en_US |
dc.identifier.endpage | 270 | en_US |
dc.relation.journal | 2017 40Th International Conference on Telecommunications and Signal Processing (Tsp) | en_US |
dc.relation.publicationcategory | Konferans Öğesi - Uluslararası - Kurum Öğretim Elemanı | en_US |