| dc.description.abstract | Introduction. Leaf area measurements are used commonly in the study of growth and development of fruit trees. These measurements can be made destructively by using a variety of sensitive instruments and/or non-destructively by using models of leaf area estimation. For models of leaf area estimation, some leaf parameters such as the length and width of leaves are usually used in the measurements. Construction of a model of leaf area estimation. Computer programs such as Excel, SAS and SPSS may be used in this process. In brief, after a leaf has been placed on a sheet of paper and photocopied, a digital planimeter or suitable tool may be used to measure the actual leaf area. The leaf width (W) and length (L) of the leaves sampled can be measured by a simple ruler. After this, regression analysis of the data may be performed separately for each genotype, species or cultivar. The analysis can be conducted with various subsets of the independent variables; for instance, leaf length (L), leaf width (W), L-2, W-2 and [L-2/W-2] to develop the best model for predicting leaf area. Regression analyses should be carried out until the deviation sum of squares is minimized. Models of leaf area estimation for specific crops. In our study, prediction models of leaf area were developed by referring to the relevant current literature that studied such fruits as avocado, banana, blackberry, cacao, cherry, chestnut, grape, guava, kiwifruit, lotus plum, peach, pistachio, rabbiteye blueberry, red currant, red raspberry, sour orange, strawberry, pecan and white mulberry. Advantages and disadvantage of the models of leaf area estimation. Some advantages and a disadvantage of models of leaf area estimation are presented. Conclusion. Our mini-review has shown that the models which have been formulated and which will develop in the future for some fruit species can be reliably used. | en_US |
