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dc.contributor.authorKabadayi, O
dc.date.accessioned2020-06-21T15:43:22Z
dc.date.available2020-06-21T15:43:22Z
dc.date.issued2004
dc.identifier.issn0031-8949
dc.identifier.issn1402-4896
dc.identifier.urihttps://doi.org/10.1238/Physica.Regular.069a00135
dc.identifier.urihttps://hdl.handle.net/20.500.12712/21601
dc.descriptionWOS: 000189179600011en_US
dc.description.abstractIn this study we calculated channelled ion ranges of boron ions by using an impact parameter dependent stopping power model. Impact parameter dependent stopping powers for boron ions penetrating into Si (100) are investigated first for energies from 10 to 150 keV. We assumed that impact parameter dependent stopping powers can be expressed by a modified Oen-Robinson formula [1] (Oen et al. Nucl. Instr. Meth. B132, 647 (1976)). The model is implemented by developing a computer code to solve a differential equation numerically for which mean ion ranges can be obtained. The results are compared with experimental data as well as Crystal-TRIM. SRIM and similar procedures calculating ion ranges in solids. We have found an agreement between our results and literature.en_US
dc.language.isoengen_US
dc.publisherIop Publishing Ltden_US
dc.relation.isversionof10.1238/Physica.Regular.069a00135en_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleRanges of channelled keV B ions in Si crystals with impact parameter dependent stopping poweren_US
dc.typearticleen_US
dc.contributor.departmentOMÜen_US
dc.identifier.volume69en_US
dc.identifier.issue2en_US
dc.identifier.startpage135en_US
dc.identifier.endpage138en_US
dc.relation.journalPhysica Scriptaen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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