Estimation of the section thickness and optical disector height with a simple calibration method - Reply
dc.contributor.author | Korkmaz, A | |
dc.contributor.author | Tumkaya, L | |
dc.date.accessioned | 2020-06-21T15:53:05Z | |
dc.date.available | 2020-06-21T15:53:05Z | |
dc.date.issued | 1998 | |
dc.identifier.issn | 0022-2720 | |
dc.identifier.uri | https://hdl.handle.net/20.500.12712/22546 | |
dc.description | WOS: 000074444800003 | en_US |
dc.description.abstract | … | en_US |
dc.language.iso | eng | en_US |
dc.publisher | Blackwell Science Ltd | en_US |
dc.rights | info:eu-repo/semantics/closedAccess | en_US |
dc.title | Estimation of the section thickness and optical disector height with a simple calibration method - Reply | en_US |
dc.type | letter | en_US |
dc.contributor.department | OMÜ | en_US |
dc.identifier.volume | 190 | en_US |
dc.identifier.startpage | 292 | en_US |
dc.identifier.endpage | 292 | en_US |
dc.relation.journal | Journal of Microscopy-Oxford | en_US |
dc.relation.publicationcategory | Diğer | en_US |
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