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dc.contributor.authorKorkmaz, A
dc.contributor.authorTumkaya, L
dc.date.accessioned2020-06-21T15:53:05Z
dc.date.available2020-06-21T15:53:05Z
dc.date.issued1998
dc.identifier.issn0022-2720
dc.identifier.urihttps://hdl.handle.net/20.500.12712/22546
dc.descriptionWOS: 000074444800003en_US
dc.description.abstracten_US
dc.language.isoengen_US
dc.publisherBlackwell Science Ltden_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleEstimation of the section thickness and optical disector height with a simple calibration method - Replyen_US
dc.typeletteren_US
dc.contributor.departmentOMÜen_US
dc.identifier.volume190en_US
dc.identifier.startpage292en_US
dc.identifier.endpage292en_US
dc.relation.journalJournal of Microscopy-Oxforden_US
dc.relation.publicationcategoryDiğeren_US


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