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dc.contributor.authorBulut A.
dc.contributor.authorKarabulut B.
dc.contributor.authorBaşaran E.
dc.contributor.authorRobinson J.
dc.date.accessioned2020-06-21T09:15:28Z
dc.date.available2020-06-21T09:15:28Z
dc.date.issued2000
dc.identifier.issn1300-0101
dc.identifier.urihttps://hdl.handle.net/20.500.12712/2726
dc.description.abstractA glancing incidence EXAFS experiment has been carried out with evaporated silver films on glass substrates. Prior to EXAFS data collection, a reflectivity curve was performed from which the critical angle for total external reflection of x-rays from surface were determined. The analysed EXAFS data revealed that there is a reduction in the coordination number and an increase in Debye-Waller factor compared to bulk values. These changes were explained in terms of grain size effect and the surface effects of the silver film.en_US
dc.language.isoengen_US
dc.rightsinfo:eu-repo/semantics/closedAccessen_US
dc.titleA glancing incidence Exafs Study of evaporated silver films on glassen_US
dc.typearticleen_US
dc.contributor.departmentOMÜen_US
dc.identifier.volume24en_US
dc.identifier.issue4en_US
dc.identifier.startpage551en_US
dc.identifier.endpage556en_US
dc.relation.journalTurkish Journal of Physicsen_US
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıen_US


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